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Multipurpose field emission transmission electron microscope with high spatial resolution and improved analytical performance.
- Partner:The University of Sheffield
- Facility:Sorby Centre
- Availability:Available
Or call us now on 0161 275 8382
Detailed Description
The JEOL JEM-F200 is a 200 kV S/TEM equipped with a Cold Field Emission Gun for high brightness and a narrow energy spread, supporting high energy resolution electron energy loss spectroscopy (EELS).
Dual Silicon Drift Detectors (SDD) enable high sensitvity and throughput X-ray analysis.
The F200 features a quad lens condenser system to independently control intensity and convergence angle, the SpecPorter automated sample holder transfer system and a PicoStage to carry out prcise sample movments and a GATAN OneView camera to provide 16 megapixel imaging and video capabilities for TEM.
Uses/Applications
The F200 is capable of high sensitivity and resolution materials analysis.
Key features
- Accelerating Voltages of 200 and 80 kV
- Improved Cold FEG with narrow energy spread
- Quad lens condenser system
- SpecPorter automated sample holder transfer system
- GATAN OneView Camera
- Dual Silicon Drift Detectors
- GATAN Quantum GIF
- TEM/STEM Tomography holder