Oxford Instrument Asylum - MFP-3D

Atomic Force Microscope (AFM)

The MFP-3D Origin™ offers high-resolution imaging, supports large samples, most imaging modes, and many accessories.

  • Partner:Imperial College London
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Detailed Description

The MFP-3D AFM extend beyond basic topography measurements with a diverse set of available accessories designed to enhance the capabilities of the AFM. These include accessories for making nano-electric measurements, for example conductivity and piezoelectric response, measurements under magnetic fields, measuring nanomechanical properties, and controlling the temperature and humidity. The MFP-3D accessories make it one of the more versatile AFMs on the market suited for a wide range of applications and research.