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JEOL ARM 200F Scanning Transmission Electron Microscope
Scanning Transmission Electron Microscope
Equipped with a Cs-corrector for the electron probe enabling atomic resolution imaging in a wide range of materials. The system includes STEM-bright field and STEM-HAADF detectors.
- Partner:University of Oxford
- Facility:David Cockayne Centre for Electron Microscopy
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Detailed Description
With a cold-field emission gun and Gatan Quantum EEL spectrometer quantitative EELS and spectrum imaging is possible down to the atomic scale. EDX mapping using the JEOL Centurio high solid-angle EDX spectrometer may be combined with simultaneous HAADF imaging and EELS. In addition, it is capable of annular bright-field imaging and also has a direct electron detector optimised for ptychography; both of which are ideal imaging modes for analysis of light elements such as lithium in energy storage material applications. A vacuum transfer holder is available for handling air sensitive materials.