Field Emission Gun Scanning Electron Microscope (FEG-SEM)
Atoms to Devices
The high-resolution field emission gun scanning electron microscope (FEGSEM) is a valuable tool for the imaging and analysis of nanoscale materials. Some nanosize oxides and thermoplastics are sensitive to high accelerating voltage. Very high-resolution images may be obtained by this FEGSEM using low accelerating voltages. These conditions enable the observation of non-conducting dry samples. Current research includes characterisation of carbon nanotubes (image left below), grain growth and orientation in processed metals, X-ray analysis and characterisation of glasses, ceramic coatings and metals, and imaging of nanoporous materials.
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