2d Material

JSM6400 SEM

Scanning Electron Microscope

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Scanning Electron Microscope (SEM)
Atoms to Devices

This JSM6400 SEM scanning electron microscope is fitted with Oxford Instruments INCA energy dispersive analytical system (EDS) for elemental x-ray analysis and digital image capture enabling line scans and x-ray maps to be produced. Samples should ideally be flat and polished for quantitative analysis and mapping though samples smaller than 32mm across can be accommodated for semi-quantitative and qualitative analysis and can be any dry solid or powder. The x-ray microanalysis provides important information about features that effect behaviour of materials in working environments. This technique can be employed to examine wide range of materials.


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