2d Material

JEOL JSM 5610 LV

Variable Pressure Scanning Electron Microscope (SEM)

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Variable Pressure Scanning Electron Microscope (VP-SEM)
Atoms to Devices

Variable Pressure SEM JEOL JSM 5610 LV (0.5-35kV). Wet samples change character when dried, thus appearing different in the SEM examination than in their native state. The variable vacuum mode in this SEM (1 to 270 Pa) allows imaging of samples containing moisture, such as cells on bioglass substrates, without the need for desiccation and pores structure without the need for coating. The Scanning Electron Microscope fitted with Secondary Electron detector and Backscattered Electron Detector makes this SEM very popular as a tool for fast micro structural analysis.


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