High Pressure Photoelectron Spectroscopy (HiPPES)
Atoms to Devices
X-ray photoelectron spectroscopy (XPS) and ultra-violet photoelectron spectroscopy (UPS) are fundamental techniques in the analysis of the surfaces of materials providing key information on their elemental composition and electronic properties.
The system is equipped with state-of-the-art monochromated X-ray and UV sources and an hemispherical electron energy analyser capable of operating from UHV up to 25 mbar (XPS only) while dosing a variety of gases (air, N2, O2, H2, H2O, CO2, etc.) or gas mixtures.
VG Scienta R4000 HiPP-2 XPS/UPS analyser, MX650 monochromated X-ray source, VG Scienta VUV5000 monochromated UV source and FG300 flood gun for charge compensation
Sample analysis Temperature = -140 to 1000 ˚C
Preparation chamber: Argon sputter, electron beam annealing and LEED optics.
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