Electrical Characterisation Suite

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Electrical Characterisation Suite
Materials for Energy Efficient ICT

The electrical characterisation suite consists of state-of-the-art equipment for high voltage and high frequency measurements.

Cascade Tesla, 200 mm, high voltage, semiautomatic probe station, ratings are up to 100 A and 3kV for wafer level measurements and 0.01 fA to 500 A and 10 kV for packaged samples.

Keysight B1505A Semiconductor Parametric Analyser/Curve Tracer with C-V capability from 1 kHz to 25 MHz with a combined voltage rating of 3 kV. A number of stand-alone, high precision Source Measure Units (SMUs). A high voltage capable, Keysight 2 GHz Oscilloscope which can capture switching transients up to 4 kV.

MGV Star Lab Antenna Measurement System (650MHZ-18GHz) and a Keysight N222A PNA Network Analyser (10 MHz to 26.5 GHz). A Keysight 65 GSa/s Arbitrary Waveform Generator and a Keysight Infiniium 20 GHz Oscilloscope are also available in the suite.


This suite allows for very accurate testing and characterisation of devices and materials in wafer, die or packaged forms, from -55° C to +300° C.

The electrical characterisation suite also includes high frequency test equipment. In particular, the antenna testing system, in combination with the network analyser, allows accurate measurement of antenna radiation patterns. The vector analyser can also be used independently to measure scattering parameters of devices and systems.

It can also be used to investigate programming kinetics of resistive switches/phase change memories.

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